Spire has announced that it has received a contract from the United States Department of Energy (DOE) to develop a microcrack detection technique for silicon solar cells and wafers.
This automated diagnostic system will enable solar cell and module manufacturers to significantly reduce the cost and improve the reliability of their PV modules.
Both mono- and multi-crystalline solar cells and wafers occasionally contain microcracks that are difficult or impossible to detect by visual inspection. These cracks can propagate during module assembly or after installation, resulting in cell breakage and module power loss.
Spire will investigate a microcrack detection technique that can be used as an in-process diagnostic method for identifying defective crystalline silicon wafers or solar cells in a production line.
This new diagnostic capability will enable solar cell and module manufacturers to reduce labor requirements for inspection and rework, increase production yields, and improve module reliability and lifetime in the field.
Upon successful demonstration of the crack detection technology, it will be engineered into Spire's production cell test, cell string, and assembly equipment.
